Abstract: The shrinking of technology nodes has led to high density memories containing large amounts of transistors which are prone to defects and reliability issues. Their test is generally based on ...
Abstract: This brief presents a wideband continuous-rate reference-less ring-oscillator-based PAM4 CDR. Our proposed frequency-detection-gain-enhanced phase/frequency detector (GE-PFD), in which only ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback