Capacitance-voltage (C-V) testing is widely used to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures. However, other types of semiconductor devices and technologies ...
The sensitivity of digital circuits to process variations is continuously increasing with scaling in MOSFET devices. The effect of process variations has a substantial impact on the power, performance ...
There comes a time at every foundry and IC design company when it becomes necessary to run a correlation between a rule-based parasitic extraction (PEX) table and a field solver solution. And when ...
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