Creating a proper CAN eye-diagram measurement on a scope’s display requires much more than just triggering on rising and/or falling edges. Eye-diagram mask testing is used in a broad range of today’s ...

If your company is at the forefront of the PC industry, by now you are probably aware that USB 3.0 is here. Controller chips are starting to ship, and you are already dealing with design issues around ...

When it comes to compliance test, USB 3.0 has more in common with PCI Express and Serial ATA than with USB 2.0. Tektronix's Chris Loberg takes you through what you'll need to know to gain USB 3.0 ...

Signal integrity is a critical design consideration in modern electronic systems, particularly those that depend on high-speed interconnects. As data rates climb and interconnect geometries become ...