The August print issue of EE-Evaluation Engineering includes a special report on power electronics test. In preparation for that article, we asked test equipment vendors to provide information on ...
Advanced AI/CPU processors demand extreme high frequency and power performance from SLT and ATE test sockets. These sockets are in the critical path at the end of a very costly silicon fabrication and ...
Far-field and radiating near-field are two options for high-volume over-the-air (OTA) testing of antenna-in-package (AiP) modules with automated test equipment (ATE) [1]. In this article, we define an ...
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