A technical paper titled “High-speed mapping of surface charge dynamics using sparse scanning Kelvin probe force microscopy” was published by researchers at Oak Ridge National Laboratory, (ORNL), ...

Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

A review paper presents an integrated AFM framework for observing, manipulating, and engineering ferroelectric materials at ...

Using a Kelvin probe force microscope, scientists visualized how chiral perovskites regulate electron spin, offering new insights that could guide the design of next-generation spintronic devices.

For smartphones and computers to become smaller and faster, technologies capable of precisely controlling electrical ...

What is Electrostatic Force Microscopy? Electrostatic Force Microscopy (EFM) is a scanning probe microscopy technique that measures the electrostatic interactions between a conductive probe and a ...

A cryogen-free optical-coupled scanning probe microscope based on remote helium liquefaction has enabled months-long ...

An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...

A major advantage of atomic force microscopes (AFMs) is their versatility in integrating various operational modes that assess different material properties and functionalities. Among the most ...