Clean, safe and economical nuclear energy requires new materials capable of withstanding severe radiation damage. One strategy of imparting radiation resistance to solids is to incorporate into them a ...

Organic-inorganic halide perovskite materials have excellent optical capture capacity and carrier conductivity. Perovskite solar cells, with amazing power conversion efficiency, show great application ...

The cell-aware test methodology is well suited for addressing defect mechanisms specific to FinFETs. Consider a FinFET transistor with three fins. Research suggests that two defect types should be ...

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

As the digital semiconductor manufacturing process moves into the FinFET era, more and more front-end-of-line (FEOL) defects are observed due to extremely small feature size and complex manufacturing ...