Keithley Instruments has announced the publication of Parallel Test Technology: The New Paradigm for Parametric Testing, a handbook that covers semiconductor parametric testing. The free, 60-page book ...
Time is money in electronics, as in other industries, and the more time that is invested in testing chips means more costs being added to the product in question. To speed up testing for memory ...
It seems simple. If you want to cut the cost of test for an IC, you should double or even quadruple the number of devices you test in parallel. After all, memory manufacturers have proven the value of ...
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