Infrared thermal imaging is a much better detective, with 50 percent of study participants picking out all holes intentionally drilled into a test apron compared with just 6 percent of participants ...
Advanced Defect Inspection Techniques For nFET And pFET Defectivity At 7nm Gate Poly Removal Process
During 7nm gate poly removal process, polysilicon is removed exposing both NFET and PFET fins in preparation for high-k gate oxide. If the polysilicon etch is too aggressive or the source and drain ...
WASHINGTON - (Nov. 8, 2017) - The fingertips are among the body's most sensitive areas and have the ability to detect very subtle changes to the surface of an object. For this reason, inspectors ...
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