An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...
For smartphones and computers to become smaller and faster, technologies capable of precisely controlling electrical ...
A review paper presents an integrated AFM framework for observing, manipulating, and engineering ferroelectric materials at ...
Associate Professor Hiroto Sekiguchi and Ph.D. candidate Hiroki Yasunaga in the Department of Electrical and Electronic Information Engineering at Toyohashi University of Technology have developed a ...
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