This article has been updated in January 2024. High resolution images of microscopic samples can be obtained experimentally using Scanning Electron Transmission Microscopy (STEM). It is an effective ...
TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (www.jeol.com) (President Gon-emon Kurihara) announces the release of a new benchtop scanning electron microscope (SEM), the JCM-7000 series NeoScope TM, ...
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