A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

Intel this week revealed defect density metrics for its 18A (1.8nm-class) process technology and said that it was healthy at the Deutsche Bank's 2024 Technology Conference. The company also said that ...

Today's systematic and more subtle random defects are not only decreasing yields, but are also increasing the number of test escapes, or defective parts per million (DPPM) shipped out. One of the ...

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