New manufacturing test challenges are raised with SoC technology advances where both test quality and test costs are affected with a direct impact on current Design-For-Test (DFT) methodologies and ...
Why isolated flows negatively impact design schedule and PPA. Benefits of unified DFT, synthesis, and physical design flows. Physical implementation optimization methods for test compression and scan ...
Through generations of technology advances, I’ve seen that as a particular task gets more important and usually more complex, it becomes the target of automation and so becomes greatly simplified.
Semiconductor companies are racing to develop AI-specific chips to meet the rapidly growing compute requirements for artificial intelligence (AI) systems. AI chips from companies like Graphcore and ...
This paper describes how using a smarter DFT infrastructure and automation can greatly improve the DFT schedule. A structural DFT infrastructure based on plug-and-play principles is used to enable ...
To achieve higher quality on multimillion gate designs and high-speed ASICs, manufacturers are relying on structured DFT (design-for-test) methodologies such as scan, at-speed test, scan compression, ...
Atrenta Inc., the leading provider of SoC Realization solutions for the semiconductor and consumer electronics industries, announced that MediaTek has adopted Atrenta's SpyGlass DFT (Design for Test) ...
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